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Elemental Mapping with the Uji Proton Microprobe (A. NATURAL SCIENCE)
https://kpu.repo.nii.ac.jp/records/5462
https://kpu.repo.nii.ac.jp/records/5462bbc8a9a0-1db0-45fc-9601-d7854da11f99
名前 / ファイル | ライセンス | アクション |
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KJ00000079588.pdf (416.9 kB)
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Item type | [ELS]紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2017-02-20 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Elemental Mapping with the Uji Proton Microprobe (A. NATURAL SCIENCE) | |||||
その他(別言語等) | ||||||
その他のタイトル | 宇治プロトンマイクロプローブによる元素分布測定(A. 理学) | |||||
言語 | ja | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ | departmental bulletin paper | |||||
著者 |
春山, 洋一
× 春山, 洋一× 青木, 敦× 戸崎, 充男× 富田, 道男× 吉田, 紘二× 福沢, 文雄 |
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抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | The Uji scanning microprobe system has been improved for elemental mapping. By collimation and focusing with a magnetic quadrupole doublet the proton beam size is reduced to 2×6μm^2 with currents of∿10pA. Elemental mapping was performed by scanning the proton beam in both dimensions across the sample surface and by detecting the secondary electron, X-ray and the scattered charged particle from the surface. Some examples of microprobe measurements are presented. | |||||
言語 | en | |||||
書誌情報 |
ja : 京都府立大学学術報告. 理学・生活科学 en : The scientific reports of the Kyoto Prefectural University. Natural science and living science 巻 40, p. 1-5, 発行日 1989-11-18 |
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雑誌書誌ID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN00062300 | |||||
ISSN | ||||||
収録物識別子タイプ | PISSN | |||||
収録物識別子 | 0075739X |